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![[]](asets/bullet.gif) Short biography
Dr. Zaid Al-Ars received the MSc and PhD degrees in electrical engineering, both with honors, from the Delft University of Technology in Delft, the Netherlands.
He is currently an assistant professor in the Delft University of Technology.
Dr. Al-Ars has more than 6 years of experience with the industry and the academia as a consultant and a researcher on test issues
in general, and memory testing in particular. He spent a number of years with Infineon Technologies (former Siemens Semiconductors)
in Munich, Germany, where he was responsible for constructing new test methodologies to reduce the overall cost of their test flow.
He published numerous papers in the field of electrical defect simulation, fault modeling, and test generation in memory devices, most of which are based
on cooperation with international industrial partners in the semiconductor industry, such as Intel, ST Microelectronics and others. He is a member of the
reviewing committees of various international conferences and journals. Dr. Al-Ars is a member of the IEEE.
Research interests
- Design and testing of both stand-alone as well as embedded memory
- Built-In Self-Test (BIST) and Self-Repair (BISR) of memory arrays
- Design for testability (DFT) techniques
- Logic testing, diagnosis, and IC reliability
- Inductive fault analysis (IFA) and yield improvement of defective ICs
- Computer-aided design (CAD) tools for fault analysis and test
Publications
Personal Stuff
How to reach me
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